Our patented technology allows you to capture spectra at over 1000 spectra per second. Imagine the possibilities.
Examine the combustion of fuels. Analyze non-reversible rapid reactions. Obtain spectra on a high throughput process. There’s no scanning or purging involved. Speeds are only limited by digital camera speed (IR detector) and computer processing time. Systems can be optimized for maximum speed.
Collection of a spectrum with and FT-IR takes a significant amount of time. Although the observation (collection) time for a single spectrum is very short, it is almost always necessary to co-add a number of spectra to improve the signal to noise ratio to an acceptable level. Also the reference and sample spectra are collected serially, with a nitrogen purge required after the sample chamber is opened. This purge can take anywhere from 10 – 20 minutes to reduce the water vapor content in the sample chamber to acceptable levels
If with an FT-IR each scan takes 0.5 seconds, and it is necessary to co-add 100 scans, then a total of 50 seconds of observation time is required. If the sample is stable, and the sampling conditions do not change, this extended time does not present a problem. However, if the sample changes during the collection time (i.e. a reaction mixture), the resulting spectrum is a blend of all the spectra taken during that time. If the reaction is a non-reproducible event, (explosion, ignition, photosynthesis, etc.); then collection of useful spectral data is not possible.
Despite these shortcomings, the use of infrared spectroscopy has grown in almost every application area. Analysts have learned to accept or perform complicated “work-arounds” to handle most of the inherent problems.
Now, a new approach, using an array based detector has been developed and it overcomes the problems posed by rapidly varying samples, long purge times and aqueous based materials.
The use of array based detectors in UV/Visible, Near Infrared, and Raman spectroscopy has, in the past few years, shown the value of using these unique detector technologies. With no moving parts and extremely rapid acquisition times, these analytical techniques have become much more useful in addressing various problems in these spectral regions.
The extension of planar array technology into the mid infrared is the obvious next step. Work has been done at the University of Delaware for almost a decade proving the concept and a number of publications have resulted. A commercial development of the technology is now available; as a result, this technique will be available to researchers, analysts, quality control, and process control specialists.